WebOct 23, 2008 · This paper presents an overview of 65 nm poly gate fabrication challenges emerged during the device performance & yield enhancement on 300 mm wafer. The … WebApr 6, 2024 · In this study, we developed a facilitated ferroelectric high-k/metal-gate n-type FinFET based on Hf0.5Zr0.5O2. We investigated the impact of the hysteresis effect on device characteristics of various fin-widths and the degradation induced by stress on the ferroelectric FinFET (Fe-FinFET). We clarified the electrical characteristics of the device …
UHF-ECR Plasma Etching System for Dielectric Films of Next …
WebA method is provided for fabricating a semiconductor device. The method includes removing a silicon material from a gate structure located on a substrate through a cycle including: etching the silicon material to remove a portion thereof, where the substrate is spun at a spin rate, applying a cleaning agent to the substrate, and drying the substrate; and … WebJun 1996 - Jan 19981 year 8 months. Fayetteville, Arkansas. Ground-up research and development of lithography, metal-dep, strip, cleans and trailblazing dry-etch process of anisotropic, highly ... highlight variance excel
65nm poly gate etch challenges and solutions IEEE Conference Publication IEEE Xplore
WebIn conclusion, the over-etch processes in poly-gate etch are studied with the focus on the notch and foot profile. In addition, the mechanism of over-etch in poly-gate etching has … WebPoly gate etching, evolving CG and FG formation, as the dominator for the poly gate profile, confronts critical challenges as the line fluctuation known as wiggling, side wall bowing, … Weba tremendous challenge for etching WSi x gate, unless we have very high WSi to poly-Si selectivity and better etch rate micro-loading. Several studies [6] on WSi x /poly-Si etching have been reported to address these problems in ICP [7] and ECR [1] plasma etcher. However, none of them were able to achieve a better CD bias, a higher selectivit,y ... small pears names